Power Quality Definitions CLONE -Omnibus issue for Aclara (David Haynes) comments

General: The terms used are defined in the relevant protcols/standard; the nature of what is measured is similar across all such protocols, hence the names (which may not necessarily match any specific protocol/standard). The criteria and measurement protocol are what's defined elsewhere; an exhaustive naming of all possible standards and protcols would not add to the usefulness of the specification. The definitions in EMIX are indicative, as they vary depending on the measurement protcol. We have added specific references to IEC 61000-4-30-2003, Electromagnetic compatibility (EMC) - Part 4-30: Testing and measurement techniques - Power quality measurement methods EN50160-2000 (2003) Electromagnetic Compatibility (EMC) - Part 4-30: Testing and Measurement Techniques - Power Quality Measurement Methods, Edition 2, June. IEEE1519 IEEE1159-2009, IEEE Recommended Practice for Monitoring Electric Power Quality, ieee.org As well as published papers and a book on the subject. The terminology largely matches that of IEC61000-4-30; each item seems to have a clear analog in the naming of each MeasurementMethodology (each of which also includes criteria for "good" power quality). Corrections made to the text: References added. FlickerST and FlickerLT, rather than Flicker Clearly separated the Mains Voltage (some protocols specify e.g. only 240v) from MainsSignalingVoltage (powerline carrier voltage usually RMS). Specific notes: 820 "Flicker": recommend leaving as-is. EMIX does not define flicker; rather it offers a container for the count of flicker events during the period. this would be however the underlying technology computed those counts, and governed by whatever agreement was in place between the two parties interested in this count. 820 "Voltage Dips": recommend leaving as-is. EMIX does not define voltage dips; rather it offers a container for the count of voltage dip events during the period. this would be however the underlying technology computed those counts, and governed by whatever agreement was in place between the two parties interested in this count. IEEE 1159-2009, for example, states: "Similarly, the category short duration variations is used to refer to voltage dips and short interruptions." p. 4. One might be able to infer, therefore, that this refers to a short duration variation of the supply voltage, IF one was using the IEEE standard as one's reference. IEEE 1564 is not a published standard (per webstore search) though there is an active PAR for the work. The committee site shows the latest activity as July 2010 ( http://grouper.ieee.org/groups/sag/meetings/2010-07-notes.pdf ) 820 "interruptions": recommend using three terms, momentary interruption, temporary interruption, sustained interruption per IEEE 1159-2009, pp. 2-3. 820 "temp overvoltage": recommend using "Voltage Swell". there are three properties of this that are defined in IEEE 1159-2009 (p. 6), instantaneous, momentary and temporary, that could be used here. however, if this is being used as a defined container for a count of events, the decision to apply a restriction to what type of swell lies with the two parties interested in this count. "surge" is not recommended. See note above about IEEE 1564. 820 "supply voltage imbalance": recommend leaving as-is. EMIX does not define supply voltage imbalance; rather it offers a container for the count of those events during the period. this would be however the underlying technology computed those counts, and governed by whatever agreement was in place between the two parties interested in this count. 820 technical "Harmonic voltage" recommend leaving as-is This is specifically defined by the measurement protocol (e.g. ieee1159-2001, en50160. This refers in the referenced standards to the residual distorted waveform after subtracting the main waveform. Line (or MainsVoltage) is the reference point against which over/undervoltage, flicker, etc are measured.